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KMID : 0879420000020010007
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Journal of the Implant Research
2000 Volume.2 No. 1 p.7 ~ p.14
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Transmission Electron Microscopic Study of Peri-Implant Tissues Related to Overloading
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Abstract
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KEYWORD
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Overloading, Failed Implant, Peri-Implant Tissues, Micro-Organism, Transmission Electron Microscope
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Listed journal information
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